Beating temporal phase sensitivity limit in off-axis interferometry based quantitative phase microscopy

Phase sensitivity determines the lowest optical path length value that can be detected from noise floor in quantitative phase microscopy (QPM). The temporal is known to limited by both photon shot and a variety of sources electronic devices environment. To beat limit, we explore various ways reduce different factors off-axis interferometry-based QPM with laser illumination. Using high electron-well-capacity camera, measured values using non-common-path common-path systems under environmental conditions. A frame summing method spatiotemporal filtering are further used contributions, thus enabling us push overall less than 2 pm.